Atomic-Force-Microscope

An AFM based on standard parts only. Driving of the x,y and z axis takes place by piezoelectric acoustic transducers at +/- 30 V. The deflection of the probe tip (made of etched tungsten wire from an incandescent light bulb) is measured by a reflected laser and a photodetector IC for optical pickups of CD drives.

Surface of a tilted silicon wafer and a tilted rolled metal sheet

Surface of fine sandpaper

Sample holder with laser illuminated probe

Electronics

A free software tool for SPM data visualization and analysis: Gwyddion